Real-device real-time optimization for advanced DRAM circuit performance

Micron Technology Group develops and manufactures DRAM products, where complex circuit performance tuning has long been a challenge. As device scaling advances, maintaining sufficient operating margins has become increasingly difficult, leading to more numerous and complex tuning test modes on actual devices. To address this, we adopted the modeFRONTIER optimization solution. By optimizing over more than 20 parameters and evaluating trade-offs through multi-objective analysis, we achieved rapid performance improvement and early determination of manufacturing conditions. This presentation introduces a wafer-level, real-device case demonstrating real-time optimization via remote access to test equipment across global manufacturing sites.